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document no. e1670e30 (ver. 3.0) date published january 2011 (k) japan printed in japan url: http://www.elpida.com ? elpida memory, inc. 2010-2011 data sheet 4gb ddr3 sdram so-dimm EBJ41UF8BCS0 (512m words 64 bits, 2 ranks) specifications ? density: 4gb ? organization ? 512m words 64 bits, 2 ranks ? mounting 16 pieces of 2g bits ddr3 sdram sealed in fbga ? package: 204-pin socket type small outline dual in line memory module (so-dimm) ? pcb height: 30.0mm ? lead pitch: 0.6mm ? lead-free (rohs compliant) and halogen-free ? power supply: vdd = 1.5v 0.075v ? data rate: 1600mbps/1333mbps (max.) backward compatible to1066mbps/800mbps/667mbps ? eight internal banks for concurrent operation (components) ? interface: sstl_15 ? burst lengths (bl): 8 and 4 with burst chop (bc) ? /cas latency (cl): 5, 6, 7, 8, 9, 10, 11 ? /cas write latency (cwl): 5, 6, 7, 8 ? precharge: auto precharge option for each burst access ? refresh: auto-refresh, self-refresh ? refresh cycles ? average refresh period 7.8 s at 0 c tc + 85 c 3.9 s at + 85 c < tc + 95 c ? operating case temperature range ? tc = 0 c to +95 c features ? double-data-rate architecture: two data transfers per clock cycle ? the high-speed data transfer is realized by the 8 bits prefetch pipelined architecture ? bi-directional differential data strobe (dqs and /dqs) is transmitted/received with data for capturing data at the receiver ? dqs is edge-aligned with data for reads; center- aligned with data for writes ? differential clock inputs (ck and /ck) ? dll aligns dq and dqs transitions with ck transitions ? commands entered on each positive ck edge; data and data mask referenced to both edges of dqs ? data mask (dm) for write data ? posted /cas by programmable additive latency for better command and data bus efficiency ? on-die-termination (odt) for better signal quality ? synchronous odt ? dynamic odt ? asynchronous odt ? multi purpose register (mpr) for pre-defined pattern read out ? zq calibration for dq drive and odt ? programmable partial array self-refresh (pasr) ? /reset pin for power-up sequence and reset function ? srt range: ? normal/extended ? programmable output driver impedance control
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 2 ordering information part number data rate mbps (max.) component jedec speed bin (cl-trcd-trp) package contact pad mounted devices EBJ41UF8BCS0-gn-f 1600 ddr3-1600k (11-11-11) gold edj2108bcse-gn-f EBJ41UF8BCS0-dj-f 1333 ddr3-1333h (9-9-9) 204-pin so-dimm (lead-free and halogen-free) edj2108bcse-gn-f edj2108bcse-dj-f detailed information for detailed electrical specifications and further information, please refer to the component ddr3 sdram datasheet edj2104bcse, edj2108bcse (e1677e).
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 3 pin configurations front side back side front side back side front side back side pin no. pin name pin no. pin name pin no. pin name pin no. pin name pin no. pin name pin no. pin name 1 vrefdq 2 vss key 143 dq35 144 vss 3 vss 4 dq4 73 cke0 74 cke1 145 vss 146 dq44 5 dq0 6 dq5 75 vdd 76 vdd 147 dq40 148 dq45 7 dq1 8 vss 77 nc 78 nc 149 dq41 150 vss 9 vss 10 /dqs0 79 ba2 80 a14 151 vss 152 /dqs5 11 dm0 12 dqs0 81 vdd 82 vdd 153 dm5 154 dqs5 13 vss 14 vss 83 a12(/bc) 84 a11 155 vss 156 vss 15 dq2 16 dq6 85 a9 86 a7 157 dq42 158 dq46 17 dq3 18 dq7 87 vdd 88 vdd 159 dq43 160 dq47 19 vss 20 vss 89 a8 90 a6 161 vss 162 vss 21 dq8 22 dq12 91 a5 92 a4 163 dq48 164 dq52 23 dq9 24 dq13 93 vdd 94 vdd 165 dq49 166 dq53 25 vss 26 vss 95 a3 96 a2 167 vss 168 vss 27 /dqs1 28 dm1 97 a1 98 a0 169 /dqs6 170 dm6 29 dqs1 30 /reset 99 vdd 100 vdd 171 dqs6 172 vss 31 vss 32 vss 101 ck0 102 ck1 173 vss 174 dq54 33 dq10 34 dq14 103 /ck0 104 /ck1 175 dq50 176 dq55 35 dq11 36 dq15 105 vdd 106 vdd 177 dq51 178 vss 37 vss 38 vss 107 a10(ap) 108 ba1 179 vss 180 dq60 39 dq16 40 dq20 109 ba0 110 /ras 181 dq56 182 dq61 41 dq17 42 dq21 111 vdd 112 vdd 183 dq57 184 vss 43 vss 44 vss 113 /we 114 /cs0 185 vss 186 /dqs7 45 /dqs2 46 dm2 115 /cas 116 odt0 187 dm7 188 dqs7 47 dqs2 48 vss 117 vdd 118 vdd 189 vss 190 vss 49 vss 50 dq22 119 a13 120 odt1 191 dq58 192 dq62 51 dq18 52 dq23 121 /cs1 122 nc 193 dq59 194 dq63 53 dq19 54 vss 123 vdd 124 vdd 195 vss 196 vss 55 vss 56 dq28 125 nc 126 vrefca 197 sa0 198 nc 57 dq24 58 dq29 127 vss 128 vss 199 vddspd 200 sda 59 dq25 60 vss 129 dq32 130 dq36 201 sa1 202 scl 61 vss 62 /dqs3 131 dq33 132 dq37 203 vtt 204 vtt 63 dm3 64 dqs3 133 vss 134 vss 65 vss 66 vss 135 /dqs4 136 dm4 67 dq26 68 dq30 137 dqs4 138 vss 69 dq27 70 dq31 139 vss 140 dq38 71 vss 72 vss 141 dq34 142 dq39
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 4 pin description pin name function a0 to a14 address input row address a0 to a14 column address a0 to a9 a10 (ap) auto precharge a12 (/bc) burst chop ba0, ba1, ba2 bank select address /ras row address strobe /cas column address strobe /we write enable /cs0, /cs1 chip select cke0, cke1 clock enable ck0, ck1 clock input /ck0, /ck1 differential clock input odt0, odt1 odt control dq0 to dq63 data input/output dqs0 to dqs7, /dqs0 to /dqs7 input and output data strobe dm0 to dm7 input mask scl clock input for serial pd sda data input/output for serial pd sa0, sa1 address input for serial pd vdd* 1 power for internal circuit vddspd power for serial pd vrefca reference voltage for ca vrefdq reference voltage for dq vss ground vtt i/o termination supply for sdram /reset set dram to a known state nc no connection note: 1. the vdd and vddq pins are tied common to a single power-plane on these designs. 1 pin 2 pin front side back side 71 pin 72 pin 73 pin 74 pin 203 pin 204 pin
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 5 serial pd matrix -dj -gn byte no. function described hex comments hex comments 0 number of serial pd bytes written/ spd device size/crc coverage 92h 176/256/0-116 92h 176/256/0-116 1 spd revision 10h rev.1.0 10h rev.1.0 2 key byte/dram device type 0bh ddr3 sdram 0bh ddr3 sdram 3 key byte/module type 03h so-dimm 03h so-dimm 4 sdram density and banks 03h 2g bits, 8 banks 03h 2g bits, 8 banks 5 sdram addressing 19h 15 rows, 10 columns 19h 15 rows, 10 columns 6 module nominal voltage, vdd 00h 1.5v 00h 1.5v 7 module organization 09h 2 ranks/ 8 bits 09h 2 ranks/ 8 bits 8 module memory bus width 03h 64 bits/non-ecc 03h 64 bits/non-ecc 9 fine timebase (ftb) divi dend/divisor 52h 5/2 52h 5/2 10 medium timebase (mtb) dividend 01h 1 01h 1 11 medium timebase (mtb) divisor 08h 8 08h 8 12 sdram minimum cycle time (tck (min.)) 0ch 1.5ns 0ah 1.25ns 13 reserved 00h ? 00h ? 14 sdram cas latencies supported, lsb 7eh 5, 6, 7, 8, 9, 10 feh 5, 6, 7, 8, 9, 10, 11 15 sdram cas latencies supported, msb 00h ? 00h ? 16 sdram minimum cas latencies time (taa (min.)) 69h 13.125ns 69h 13.125ns 17 sdram minimum write recovery time (twr (min.)) 78h 15ns 78h 15ns 18 sdram minimum /ras to /cas delay (trcd (min.)) 69h 13.125ns 69h 13.125ns 19 sdram minimum row active to row active delay (trrd (min.)) 30h 6ns 30h 6ns 20 sdram minimum row precharge time (trp (min.)) 69h 13.125ns 69h 13.125ns 21 sdram upper nibbles for tras and trc 11h ? 11h ? 22 sdram minimum active to precharge time (tras (min.)), lsb 20h 36ns 18h 35ns 23 sdram minimum active to ac tive /auto-refresh time (trc (min.)), lsb 89h 49.125ns 81h 48.125ns 24 sdram minimum refresh recovery time delay (trfc (min.)), lsb 00h 160ns 00h 160ns 25 sdram minimum refresh recovery time delay (trfc (min.)), msb 05h 160ns 05h 160ns 26 sdram minimum internal write to read command delay (twtr (min.)) 3ch 7.5ns 3ch 7.5ns 27 sdram minimum internal read to precharge command delay (trtp (min.)) 3ch 7.5ns 3ch 7.5ns 28 upper nibble for tfaw 00h 30ns 00h 30ns 29 minimum four activate window delay time (tfaw (min.)) f0h 30ns f0h 30ns 30 sdram optional features 83h dll-off, rzq/6, 7 83h dll-off, rzq/6, 7 31 sdram thermal and refresh options 81h pasr/2x refresh at +85oc to +95oc 81h pasr/2x refresh at +85oc to +95oc 32 module thermal sensor 00h not incorporated 00h not incorporated 33 sdram device type 00h standard 00h standard 34 to 59 reserved 00h ? 00h ?
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 6 -dj -gn byte no. function described hex comments hex comments 60 module nominal height 0fh 29 < height 30mm 0fh 29 < height 30mm 61 module maximum thickness 11h dual sides 11h dual sides 62 reference raw card used 45h raw card f2 45h raw card f2 63 address mapping from edge connector to dram 00h standard 00h standard 64 to 116 reserved 00h ? 00h ? 117 module id: manufacturer?s jedec id c ode, lsb 02h elpida memory 02h elpida memory 118 module id: manufacturer?s jedec id code, msb feh elpida memory feh elpida memory 119 module id: manufacturing location ? ? 120 module id: manufacturing date yy ye ar code (bcd) yy year code (bcd) 121 module id: manufacturing date ww w eek code (bcd) ww week code (bcd) 122 to 125 module id: module serial number ? ? 126 cyclical redundancy code (crc) 26h ? f3h ? 127 cyclical redundancy code (crc) 93h ? 4dh ? 128 module part number 45h e 45h e 129 module part number 42h b 42h b 130 module part number 4ah j 4ah j 131 module part number 34h 4 34h 4 132 module part number 31h 1 31h 1 133 module part number 55h u 55h u 134 module part number 46h f 46h f 135 module part number 38h 8 38h 8 136 module part number 42h b 42h b 137 module part number 43h c 43h c 138 module part number 53h s 53h s 139 module part number 30h 0 30h 0 140 module part number 2dh ? 2dh ? 141 module part number 44h d 47h g 142 module part number 4ah j 4eh n 143 module part number 2dh ? 2dh ? 144 module part number 46h f 46h f 145 module part number 20h (space) 20h (space) 146 module revision code 30h initial 30h initial 147 module revision code 20h (space) 20h (space) 148 sdram manufacturer?s jedec id code, lsb 02h elpida memory 02h elpida memory 149 sdram manufacturer?s jedec id code, m sb feh elpida memory feh elpida memory 150 to 175 manufacturer?s specific data 176 to 255 open for customer use 00h ? 00h ?
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 7 block diagram rdqs0 rdq [ 7:0 ] /rdqs0 rdm0 dq[7:0] d0 /cs dqs /dqs dm rdqs1 rdq [ 15:8 ] /rdqs1 rdm1 dq[7:0] d4 /cs dqs /dqs dm rdqs2 rdq [ 23:16 ] /rdqs2 rdm2 dq[7:0] d1 /cs dqs /dqs dm rdqs3 rdq [ 31:24 ] /rdqs3 rdm3 dq[7:0] d13 /cs dqs /dqs dm rdqs4 rdq [ 39:32 ] /rdqs4 rdm4 dq[7:0] d6 /cs dqs /dqs dm rdqs5 rdq [ 47:40 ] /rdqs5 rdm5 dq[7:0] d10 /cs dqs /dqs dm rdqs6 rdq [ 55:48 ] /rdqs6 rdm6 dq[7:0] d15 /cs dqs /dqs dm rdqs7 rdq [ 63:56 ] /rdqs7 rdm7 dq[7:0] d11 /cs dqs /dqs dm dq[7:0] d8 /cs dqs /dqs dm dq[7:0] d12 /cs dqs /dqs dm dq[7:0] d9 /cs dqs /dqs dm dq[7:0] d5 /cs dqs /dqs dm dq[7:0] d14 /cs dqs /dqs dm dq[7:0] d2 /cs dqs /dqs dm dq[7:0] d7 /cs dqs /dqs dm dq[7:0] d3 /cs dqs /dqs dm rank0 sdrams rank1 sdrams / cs0 / cs1 ba [ 2:0 ] a[ 14:0 ] /ras /cas /we cke0 cke1 odt0 odt1 ck0 /ck0 /reset all sdrams 3.3 p f zq vss 240 ? serial pd vddspd vdd a ll sdrams vtt vrefdq a ll sdrams vss all sdrams, serial pd vrefc a a ll sdrams dqs [ 7:0 ] dq [ 63:0 ] /dqs [ 7:0 ] rdqs [ 7:0 ] rdq [ 63:0 ] /rdqs [ 7:0 ] /cs [ 1:0 ] ba [ 2:0 ] a[ 14:0 ] /ras /cas /we cke [ 1:0 ] odt [ 1:0 ] vtt vtt 36 ? 36 ? 15 ? a1 sda scl a0 a2 wp u1 serial pd sa1 scl sa0 vss sd a vss note : 1. dq wiring may be changed within a byte. address, command and control line ck [ 1:0 ] /ck [ 1:0 ] vdd 30 ? 0.1 f dm [ 7:0 ] rdm [ 7:0 ] ck1 /ck1 3.3 p f all sdrams all sdrams all sdrams all sdrams all sdrams rank1 sdrams rank0 sdrams rank1 sdrams rank0 sdrams rank1 sdrams rank0 sdrams v1 v2 v3 v4 v5 v6 v7 v8 v9 v1 v4 v3 v2 v9 v8 v7 v6 v5 d8 d9 d10 d11 d12 d13 d14 d15 d4 d5 d6 d7 d0 d1 d2 d3 vtt rank0 rank1 /cs0 /cs1
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 8 electrical specifications ? all voltages are referenced to vss (gnd). absolute maximum ratings parameter symbol value unit notes power supply voltage vdd ? 0.4 to +1.975 v 1, 3, 4 input voltage vin ? 0.4 to +1.975 v 1, 4 output voltage vout ? 0.4 to +1.975 v 1, 4 reference voltage vrefca ? 0.4 to 0.6 vdd v 3, 4 reference voltage for dq vrefdq ? 0.4 to 0.6 vddq v 3, 4 storage temperature tstg ? 55 to +100 c 1, 2, 4 power dissipation pd 8 w short circuit output current iout 50 ma 1, 4 notes: 1. stresses greater than those listed under abso lute maximum ratings may cause permanent damage to the device. this is a stress rating only and functi onal operation of the devic e at these or any other conditions above those indicated in the operational sectio ns of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. storage temperature is the case surface te mperature on the center/t op side of the dram. 3. vdd and vddq must be within 300m v of each other at all times; and vref must be not greater than 0.6 vddq, when vdd and vddq are less than 500mv; vref may be equal to or less than 300mv. 4. ddr3 sdram component specification. caution exposing the device to stress above those listed in absolute maximum ratings could cause permanent damage. the device is not meant to be operated under conditions outside the limits described in the operational section of this sp ecification exposure to absolute maximum rating conditions for extended periods may affect device reliability. operating temperature condition parameter symbol rating unit notes operating case temperature tc 0 to +95 c 1, 2, 3 notes: 1. operating tem perature is the case surface temperat ure on the center/top side of the dram. 2. the normal temperature range specifies the temperatur es where all dram specifications will be supported. during operati on, the dram case temperature must be maintained between 0c to +85c under all operating conditions. 3. some applications require operation of the dram in the exte nded temperature range between +85c and +95c case temperature. full s pecifications are guarant eed in this range, but the following additional conditions apply: a) refresh commands must be doubled in frequency, therefore reducing the refresh interval trefi to 3.9s. (this double refresh requirement may not apply for some devices.) b) if self-refresh operation is required in the extend ed temperature range, t hen it is mandatory to either use the manual self-r efresh mode with extended temperature range capability (mr2 bit [a6, a7] = [0, 1]) or enable the optional auto se lf-refresh mode (mr2 bit [a6, a7] = [1, 0]).
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 9 recommended dc operating conditions (tc = 0c to +85c) parameter symbol min. typ. max. unit notes supply voltage vdd, vddq 1.425 1.5 1.575 v 1, 2, 3 vss 0 0 0 v 1 vddspd 3.0 3.3 3.6 v input reference voltage for address, command inputs vrefca (dc) 0.49 vdd ? 0.51 vdd v 1, 4, 5 input reference voltage for dq, dm inputs vrefdq (dc) 0.49 vdd ? 0.51 vdd v 1, 4, 5 notes: 1. ddr3 sdram co mponent specification. 2. under all conditions vddq must be less than or equal to vdd. 3. vddq tracks with vdd. ac parameters are measured with vdd and vddq tied together. 4. the ac peak noise on vref may not allow vref to deviate from vref(dc) by more than 1% vdd (for reference: approx 15 mv). 5. for reference: approx. vdd/2 15 mv.
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 10 dc characteristics 1 (tc = 0c to +85c, vdd = 1.5v 0.075v, vss = 0v) data rate (mbps) 1600 1333 parameter symbol max. max. unit notes operating current (act-pre) (another rank is in idd2p1) idd0 856 800 ma operating current (act-pre) (another rank is in idd3n) idd0 1080 1000 ma operating current (act-read-pre) (another rank is in idd2p1) idd1 976 920 ma operating current (act-read-pre) (another rank is in idd3n) idd1 1200 1120 ma idd2p1 592 560 ma fast pd exit precharge power-down standby current idd2p0 240 240 ma slow pd exit precharge standby current idd2n 800 720 ma precharge standby odt current idd2nt 800 720 ma precharge quiet standby current idd2q 800 720 ma active power-down current (always fast exit) idd3p 624 592 ma active standby current idd3n 1040 960 ma operating current (burst read operating) (another rank is in idd2p1) idd4r 1576 1400 ma operating current (burst read operating) (another rank is in idd3n) idd4r 1800 1600 ma operating current (burst write operating) (another rank is in idd2p1) idd4w 1616 1440 ma operating current (burst write operating) (another rank is in idd3n) idd4w 1840 1640 ma burst refresh current (another rank is in idd2p1) idd5b 2296 2200 ma burst refresh current (another rank is in idd3n) idd5b 2520 2400 ma all bank interleave read current (another rank is in idd2p1) idd7 2376 2280 ma all bank interleave read current (another rank is in idd3n) idd7 2600 2480 ma reset low current idd8 272 272 ma
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 11 self-refresh current (tc = 0 c to +85 c, vdd = 1.5v 0.075v) parameter symbol max. unit notes self-refresh current normal temperature range idd6 272 ma self-refresh current extended temperature range idd6et 352 ma auto self-refresh current (optional) idd6tc ? ma timings used for idd and iddq measurement-loop patterns ddr3-1600 ddr3-1333 parameter 11-11-11 9-9-9 unit cl 11 9 nck tck min. 1.25 1.5 ns nrcd min. 11 9 nck nrc min. 39 33 nck nras min. 28 24 nck nrp min. 11 9 nck nfaw 24 20 nck nrrd 5 4 nck nrfc 128 107 nck
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 12 pin functions ck, /ck (input pins) ck and /ck are differential clock inputs. all address and c ontrol input signals are sampled on the crossing of the positive edge of ck and negative edge of /ck. output (read) data is referenced to the crossings of ck and /ck (both directions of crossing). /cs (input pins) all commands are masked when /cs is registered high. /cs provides for external rank selection on systems with multiple ranks. /cs is considered part of the command code. /ras, /cas, and /we (input pins) /ras, /cas and /we (along with /cs) define the command being entered. a0 to a14 (input pins) provided the row address for active commands and the co lumn address for read/write commands to select one location out of the memory array in the respective bank. (a10(ap) and a12(/bc) have additional functions, see below) the address inputs also provide t he op-code during mode register set commands. [address pins table] address (a0 to a14) row address (ra) column address (ca) notes ax0 to ax14 ay0 to ay9 a10(ap) (input pin) a10 is sampled during read/write commands to determine whether auto-precharge should be performed to the accessed bank after the read/write operation. (h igh: auto-precharge; low: no auto-precharge) a10 is sampled during a precharge command to determine whether the precharge applies to one bank (a10 = low) or all banks (a10 = high). if only one bank is to be prec harged, the bank is selected by bank addresses (ba). a12 (/bc) (input pin) a12 is sampled during read and write commands to determi ne if burst chop (on-the-fly) will be performed. (a12 = high: no burst chop, a12 = low: burst chopped.) ba0 to ba2 (input pins) ba0, ba1 and ba2 define to which bank an active, read, write or precharge command is being applied. ba0 and ba1 also determine if a mode register is to be accessed during a mrs cycle. [bank select signal table] ba0 ba1 ba2 bank 0 l l l bank 1 h l l bank 2 l h l bank 3 h h l bank 4 l l h bank 5 h l h bank 6 l h h bank 7 h h h remark: h: vih. l: vil.
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 13 cke (input pins) cke high activates, and cke low deactivates, internal clock signals and device input buffers and output drivers. taking cke low provides precharge power-down and self-refr esh operation (all banks idle), or active power-down (row active in any bank). cke is asynchronous for se lf-refresh exit. after vref has become stable during the power-on and initialization sequence, it must be maintained for proper operat ion of the cke receiver. for proper self-refresh entry and exit, vref must be maintained to this input. cke must be maintained high throughout read and write accesses. input buffers, excluding ck, /ck, odt and cke are disabled during power-down. input buffers, excluding cke, are disabled during self-refresh. dq (input and output pins) bi-directional data bus. dqs and /dqs (input and output pins) output with read data, input with write data. edge- aligned with read data, centered in write data. the data strobe dqs is paired with differential signals /dqs to provide differential pair signaling to the system during reads and writes. odt (input pins) odt (registered high) enables termination resistance inte rnal to the ddr3 sdram. when enabled, odt is only applied to each dq, dqs, /dqs, dm. the odt pin will be ignored if the mode register (mr1) is programmed to disable odt. dm (input pins) dm is the reference signal of the dat a input mask function. dms are sampl ed at the cross point of dqs and /dqs. vdd (power supply pins) 1.5v is applied. (vdd is for the internal circuit.) vddspd (power supply pin) 3.3v is applied (for serial eeprom). vss (power supply pins) ground is connected. vtt (power supply pins) i/o termination supply for sdram. vrefdq (power supply pin) reference voltage for dq. vrefca (power supply pin) reference voltage for ca. /reset (input pin) /reset is negative active signal (active low) and is referred to vss.
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 14 physical outline 67.60 9.00 21.15 2.15 39.00 2.45 2.15 2.45 21.00 30.00 1 2 unit: mm 1.00 0.10 4.00 min 3.80 max (datum -a-) full r component area (back) eca-ts2-0215-02 b a c 3.00 1.65 detail b detail a 0.35 max 2.55 min 4.00 0.10 0.60 0.45 0.03 1.00 0.10 detail c full r 3.00 1.35 detail d front side back side 20.00 d 6.00 63.60 2.00 min 203 (datum -a-) component area (front) 0.2 max 0.35 max contact pad 204 4.00 0.10 note: 1. tolerances on all dimensions 0.15 unless otherwise specified.
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 15 caution for handling memory modules when handling or inserting memory modules, be sure not to touch any components on the modules, such as the memory ics, chip capacitors and chip resistors. it is necessary to avoid undue mechanical stress on these components to prevent damaging them. in particular, do not push module cover or drop the modules in order to protect from mechanical defects, which would be electrical defects. when re-packing memory modules, be sure the modules are not touching each other. modules in contact with other modules may cause excessive mechanical stress, which may damage the modules. mde0202 notes for cmos devices 1 precaution against esd for mos devices exposing the mos devices to a strong electric field can cause destruction of the gate oxide and ultimately degrade the mos devices operation. steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it, when once it has occurred. environmental control must be adequate. when it is dry, humidifier should be used. it is recommended to avoid using insulators that easily build static electricity. mos devices must be stored and transported in an anti-static container, static shielding bag or conductive material. all test and measurement tools including work bench and floor should be grounded. the operator should be grounded using wrist strap. mos devices must not be touched with bare hands. similar precautions need to be taken for pw boards with semiconductor mos devices on it. 2 handling of unused input pins for cmos devices no connection for cmos devices input pins can be a cause of malfunction. if no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. cmos devices behave differently than bipolar or nmos devices. input levels of cmos devices must be fixed high or low by using a pull-up or pull-down circuitry. each unused pin should be connected to v dd or gnd with a resistor, if it is considered to have a possibility of being an output pin. the unused pins must be handled in accordance with the related specifications. 3 status before initialization of mos devices power-on does not necessarily define initial status of mos devices. production process of mos does not define the initial operation status of the device. immediately after the power source is turned on, the mos devices with reset function have not yet been initialized. hence, power-on does not guarantee output pin levels, i/o settings or contents of registers. mos devices are not initialized until the reset signal is received. reset operation must be executed immediately after power-on for mos devices having reset function. cme0107
EBJ41UF8BCS0 data sheet e1670e30 (ver. 3.0) 16 m01e1007 no part of this document may be copied or reproduced in any form or by any means without the prior written consent of elpida memory, inc. elpida memory, inc. does not assume any liability for infringement of any intellectual property rights (including but not limited to patents, copyrights, and circuit layout licenses) of elpida memory, inc. or third parties by or arising from the use of the products or information listed in this document. no license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of elpida memory, inc. or others. descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. the incorporation of these circuits, software and information in the design of the customer's equipment shall be done under the full responsibility of the customer. elpida memory, inc. assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. [product applications] be aware that this product is for use in typical electronic equipment for general-purpose applications. elpida memory, inc. makes every attempt to ensure that its products are of high quality and reliability. however, this product is not intended for use in the product in aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment, medical equipment for life support, or other such application in which especially high quality and reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk of bodily injury. customers are instructed to contact elpida memory's sales office before using this product for such applications. [product usage] design your application so that the product is used within the ranges and conditions guaranteed by elpida memory, inc., including the maximum ratings, operating supply voltage range, heat radiation characteristics, installation conditions and other related characteristics. elpida memory, inc. bears no responsibility for failure or damage when the product is used beyond the guaranteed ranges and conditions. even within the guaranteed ranges and conditions, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating elpida memory, inc. products does not cause bodily injury, fire or other consequential damage due to the operation of the elpida memory, inc. product. [usage environment] usage in environments with special characteristics as listed below was not considered in the design. accordingly, our company assumes no responsibility for loss of a customer or a third party when used in environments with the special characteristics listed below. example: 1) usage in liquids, including water, oils, chemicals and organic solvents. 2) usage in exposure to direct sunlight or the outdoors, or in dusty places. 3) usage involving exposure to significant amounts of corrosive gas, including sea air, cl 2 , h 2 s, nh 3 , so 2 , and no x . 4) usage in environments with static electricity, or strong electromagnetic waves or radiation. 5) usage in places where dew forms. 6) usage in environments with mechanical vibration, impact, or stress. 7) usage near heating elements, igniters, or flammable items. if you export the products or technology described in this document that are controlled by the foreign exchange and foreign trade law of japan, you must follow the necessary procedures in accordance with the relevant laws and regulations of japan. also, if you export products/technology controlled by u.s. export control regulations, or another country's export control laws or regulations, you must follow the necessary procedures in accordance with such laws or regulations. if these products/technology are sold, leased, or transferred to a third party, or a third party is granted license to use these products, that third party must be made aware that they are responsible for compliance with the relevant laws and regulations. the information in this document is subject to change without notice. before using this document, confirm that this is the late st version.

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